Created for lab and R&D testing of charge- or thermally sensitive devices such as SOI and high-k transistors, the Ultra-Short Pulse IV parametric test solution provides measurements as narrow as 10 ns ...
National Instruments has expanded the capabilities of its PXI platform for semiconductor characterization and production test with new PPMU (per-pin parametric-measurement unit) and SMU ...
KTE 7-based S530 platform maximizes measurement performance and minimizes cost to help semiconductor manufacturers compete in high-growth emerging markets. Related To: Tektronix Tektronix released the ...
Taking a swipe at the cost of ownership, two additions to the Pyramid parametric probe card family allow single-pass DC and RF measurements, promising to reduce the cost of parametric production test ...
In back-end semiconductor processing it is important to improve the performance of semiconductors due to the limitations of miniaturization in front-end processes. To achieve this goal, the industry ...
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