An example of a correlative study between XRM and FIB-SEM has been presented in an earlier study. 1 This article will expand the correlation one step beneath the length scale to link FIB-SEM and TEM, ...

Using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), the researchers have been able to show how the electrode degrades during use, when performing a standardised stress ...

For materials scientists, understanding the atomic structure of a material, revealing defects, or characterizing the chemical and physical processes that occur during the creation of material, are key ...