Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
As an academic discipline, logic is the study of reasoning. Logic puzzles, therefore, involve making a series of inferences and assessing them using reasoning. Easier logic puzzles for kids tend to ...
Traditional IC pattern-generation methods focus on detectingdefects at gate terminals or at interconnects. Unfortunately, a significantpopulation of defects may occur within an IC's gates, or cells.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results