Abstract: This article proposes a method for the automatic generation of a plant model and monitoring using process mining algorithms based on recorded event logs. The behavioral traces of the system ...
Abstract: Time-dependent dielectric breakdown (TDDB) is a critical contributor to wear-out failures in semiconductors, aggravated by scaling of thin-oxide fabrication processes. Stress-induced leakage ...
Lucknow, Jan 12 (PTI) The Uttar Pradesh unit of Congress has constituted a high-profile 12-member state-level committee to monitor and coordinate party efforts related to the special intensive ...
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